Title :
Design of a high-performance 1024-B switched capacitor p-channel IGFET memory chip
Author :
Boll, H.J. ; Lynch, William T.
fDate :
10/1/1973 12:00:00 AM
Abstract :
IGFET switched-capacitor memory cells are incorporated into a fully decoded dynamic, 1024-word by 1-b p-channel random-access memory. With 10-V drive circuitry, chip access time is measured to be 150 ns and cycle time is 300 ns. Measured on-chip power dissipation at a 300 ns cycle was less than 80 mW (80 μW/b) and is correspondingly lower at lower speeds. Refresh power at 100°C is less than 1 μW/b.
Keywords :
Digital integrated circuits; Random-access storage; Semiconductor storage systems; digital integrated circuits; random-access storage; semiconductor storage systems; Capacitors; Decoding; Electrical engineering; Electronics packaging; Flip-flops; Horn antennas; Semiconductor device measurement; Silicon; Solid state circuits; Varactors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1973.1050409