DocumentCode :
878335
Title :
A static random-access memory with normally-off-type Schottky barrier FET´s
Author :
Suzuki, Shun´Ichi ; Nagahashi, Yasuhiko ; Tanaka, Takeo ; Yamada, Teruhiko ; Muta, Hiroki ; Okabayashi, Hidekazu ; Yamada, Kunio
Volume :
8
Issue :
5
fYear :
1973
Firstpage :
326
Lastpage :
331
Abstract :
A large-scale integrated memory with lower power consumption and high operating speed has been developed and evaluated. A fully decoded 256-b static random-access memory chip was fabricated by using the Enhancement-type Schottky Barrier gate FET´s, having a threshold voltage of 0.1 V, obtained by ion-implantation. The memory chip was successfully operated with an access time of less than 150 ns, and with active power consumption of 15 mW/chip. A single power supply of -1.3 V and current mode logic input levels are additional features of the memory chip.
Keywords :
Digital integrated circuits; Large scale integration; Random-access storage; Semiconductor storage systems; digital integrated circuits; large scale integration; random-access storage; semiconductor storage systems; Circuits; Energy consumption; FETs; Large scale integration; Logic; Power supplies; Random access memory; Schottky barriers; Silicon; Threshold voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1973.1050412
Filename :
1050412
Link To Document :
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