Title :
Extended optical fiber line testing system using new eight-channel L/U-band crossed optical waveguide coupler for L-band WDM transmission
Author :
Araki, Noriyuki ; Izumita, Hisashi ; Honda, Nazuki ; Nakamura, Minoru
Author_Institution :
NTT Access Network Service Syst. Labs., NTT Corp., Ibaraki, Japan
Abstract :
This paper describes the system design for an extended optical fiber line testing system that uses a new L/U-band crossed optical waveguide coupler and a fiber Bragg grating filter for L-band wavelength-division multiplexing transmission. We describe the reflection characteristic required for optical filters located in central offices in order to suppress the ghost signal caused by multireflection in the optical time-domain reflectometry (OTDR) trace. We design and evaluate an eight-channel crossed optical waveguide coupler with a new thin dielectric film filter that separates a 1650-nm test light from the L-band communication light, and confirm that there was no degradation caused by multireflections in the OTDR trace. We also demonstrate the in-service line monitoring of a 10-Gb/s L-band transmission with no degradation in the transmission quality.
Keywords :
Bragg gratings; optical communication equipment; optical design techniques; optical fibre couplers; optical fibre networks; optical fibre testing; optical time-domain reflectometry; optical waveguide filters; wavelength division multiplexing; 10 Gbit/s; 160 nm; L-Band WDM transmission; L-band wavelength-division multiplexing transmission; OTDR trace; eight-channel L/U-band; extended optical fiber line testing system; fiber Bragg grating filter; ghost signal suppression; in-service line monitoring; multireflection; optical filters; optical time-domain reflectometry trace; optical waveguide coupler; system design; thin dielectric film filter; Degradation; L-band; Optical coupling; Optical fiber testing; Optical fibers; Optical films; Optical filters; Optical waveguides; System testing; Wavelength division multiplexing;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.821761