• DocumentCode
    878930
  • Title

    Some aspects of the theory and measurement of frequency fluctuations in frequency standards

  • Author

    Cutler, L.S. ; Searle, C.L.

  • Author_Institution
    Hewlett-Packard Company, Palo Alto, Calif.
  • Volume
    54
  • Issue
    2
  • fYear
    1966
  • Firstpage
    136
  • Lastpage
    154
  • Abstract
    Precision quartz oscillators have three main sources of noise contributing to frequency fluctuations: thermal noise in the oscillator, additive noise contributed by auxiliary circuitry such as AGC, etc., and fluctuations in the quartz frequency itself as well as in the reactive elements associated with the crystal, leading to an f-1type of power spectral density in frequency fluctuations. Masers are influenced by the first two types of noise, and probably also by the third. The influence of these sources of noise on frequency fluctuation vs. averaging time measurements is discussed. The f-1-spectral density leads to results that depend on the length of time over which the measurements are made. An analysis of the effects of finite observation time is given. The characteristics of both passive and active atomic standards using a servo-controlled oscillator are discussed. The choice of servo time constant influences the frequency fluctuations observed as a function of averaging time and should be chosen for best performance with a given quartz oscillator and atomic reference. The conventional methods of handling random signals, i.e., variances, autocorrelation, and spectral densities, are applied to the special case of frequency and phase fluctuations in oscillators, in order to obtain meaningful criteria for specifying oscillator frequency stability. The interrelations between these specifications are developed in the course of the paper.
  • Keywords
    Additive noise; Circuit noise; Density measurement; Fluctuations; Frequency measurement; Length measurement; Masers; Measurement standards; Oscillators; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1966.4627
  • Filename
    1446557