DocumentCode
878965
Title
Observation of current instabilities in a dielectric-surface-loaded ntype GaAs bulk element
Author
Kataoka, S. ; Tateno, H. ; Kawashima, Mitsumasa
Author_Institution
Ministry of International Trade & Industry, Electrotechnical Laboratory, Tokyo, Japan
Volume
5
Issue
6
fYear
1969
Firstpage
114
Lastpage
116
Abstract
Experiments were performed to investigate the effect of dielectric surface loading on GaAs bulk element. Current instabilities through the element were observed with a sampling oscilloscope while a dielectric sheet moved along a GaAs element. It was found that travelling-domain-mode current oscillations are suppressed and disappear only when the whole length of GaAs surface is covered with the dielectric sheet.
Keywords
Gunn devices; Gunn effect; III-V semiconductors; semiconductor materials;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19690087
Filename
4210302
Link To Document