• DocumentCode
    878965
  • Title

    Observation of current instabilities in a dielectric-surface-loaded ntype GaAs bulk element

  • Author

    Kataoka, S. ; Tateno, H. ; Kawashima, Mitsumasa

  • Author_Institution
    Ministry of International Trade & Industry, Electrotechnical Laboratory, Tokyo, Japan
  • Volume
    5
  • Issue
    6
  • fYear
    1969
  • Firstpage
    114
  • Lastpage
    116
  • Abstract
    Experiments were performed to investigate the effect of dielectric surface loading on GaAs bulk element. Current instabilities through the element were observed with a sampling oscilloscope while a dielectric sheet moved along a GaAs element. It was found that travelling-domain-mode current oscillations are suppressed and disappear only when the whole length of GaAs surface is covered with the dielectric sheet.
  • Keywords
    Gunn devices; Gunn effect; III-V semiconductors; semiconductor materials;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19690087
  • Filename
    4210302