DocumentCode :
879278
Title :
Spectral measurements of oscillators
Author :
Tykulsky, Alexander
Author_Institution :
Hewlett-Packard Company, Palo Alto, Calif.
Volume :
54
Issue :
2
fYear :
1966
Firstpage :
306
Lastpage :
306
Keywords :
Bandwidth; Delay lines; Frequency conversion; Low-noise amplifiers; Noise measurement; Oscillators; Performance analysis; Stability; Transmission line measurements; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.4660
Filename :
1446590
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=879278
