Proton-induced secondary particle environment for infrared sensor applications

Author

Pickel, James C. ; Reed, Robert A. ; Marshall, Paul W. ; Jordan, Tom M. ; Gee, George ; Fodness, Bryan ; McKelvey, Mark ; McMurray, Robert E. ; Ennico, Kim A. ; Johnson, Roy R. ; McCreight, Craig

Author_Institution

PR&T Inc., Fallbrook, CA, USA

Volume

50

Issue

6

fYear

2003

Firstpage

1954

Lastpage

1959

Abstract

We present measurements of the proton-induced secondary particle environment in the vicinity of an infrared focal plane array. Measurements were made of the energy depositions from secondary electrons and scattered protons from the interior of a cryogenic test dewar using an infrared detector array. The results are compared with model predictions and analyzed for implications to space-based infrared sensors.

Keywords

focal planes; infrared detectors; photodetectors; proton effects; radiation hardening (electronics); secondary electron emission; cryogenic test dewar; energy depositions; infrared detector array; infrared sensor applications; proton-induced secondary particle environment; scattered protons; secondary electrons; space-based infrared sensors; Cryogenics; Electrons; Energy measurement; Infrared detectors; Infrared sensors; Particle measurements; Particle scattering; Protons; Sensor arrays; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2003.821603

Filename

1263827