Title :
Proton-induced transients and charge collection measurements in a LWIR HgCdTe focal plane array
Author :
Marshall, Paul W. ; Hubbs, John E. ; Arrington, Douglas C. ; Marshall, Cheryl J. ; Reed, Robert A. ; Gee, George ; Pickel, James C. ; Ramos, Rodolfo A.
Author_Institution :
NASA Goddard Space Flight Center, Brookneal, VA, USA
Abstract :
We compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K. Charge collection measurements describe very limited diffusion of carriers to multiple pixels showing significantly reduced particle induced cross-talk for the lateral diffusion structure.
Keywords :
II-VI semiconductors; cadmium compounds; focal planes; mercury compounds; proton effects; radiation hardening (electronics); 27 MeV; 40 K; 63 MeV; HgCdTe; LWIR HgCdTe focal plane array; charge collection measurements; lateral diffusion structure; long wavelength infrared focal plane assembly; multiple pixels; particle induced cross-talk; proton-induced transients; Charge measurement; Current measurement; Diodes; Extraterrestrial measurements; Laboratories; NASA; Protons; Radiation effects; Space technology; Wavelength measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.820749
