• DocumentCode
    879701
  • Title

    Qualitative interpretation of sensor patterns

  • Author

    Whiteley, James R. ; Davis, James F.

  • Author_Institution
    Sch. of Chem. Eng., Oklahoma State Univ., Stillwater, OK, USA
  • Volume
    8
  • Issue
    2
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    54
  • Lastpage
    63
  • Abstract
    A framework that provides the ability to generate qualitative interpretations (QIs) from multisensor trend patterns for monitoring, control, and optimization of chemical plants is presented. QIs are transformations of sensor and quality product data into useful symbolic abstractions. The framework is founded on the principles of similarity-based pattern recognition. Although demonstrated for normality identification, the machine methodology is general-purpose and applicable to any context-dependent QI problem. The objective of this approach is to create a QI-map of known pattern classes that consists of spatially distinguishable regions of patterns in an n-dimensional representation space. Creation of a QI-map is a two-step process: unsupervised map generation followed by supervised labeling. The application of the ART2 neural network for clustering in the QI-map is described. The application of the ART2-based QI-map approach to process monitoring of a recycle reactor is also described.<>
  • Keywords
    chemical engineering computing; chemical sensors; knowledge based systems; neural nets; pattern recognition; process computer control; ART2; chemical plant control; chemical plant monitoring; context-dependent QI problem; knowledge based systems; neural network; optimization; process monitoring; qualitative interpretations; recycle reactor; similarity-based pattern recognition; supervised labeling; unsupervised map generation; Automatic control; Computer displays; Context awareness; Fusion power generation; Fuzzy logic; Hybrid power systems; Mathematical model; Neural networks; Pattern recognition; Petrochemicals;
  • fLanguage
    English
  • Journal_Title
    IEEE Expert
  • Publisher
    ieee
  • ISSN
    0885-9000
  • Type

    jour

  • DOI
    10.1109/64.207429
  • Filename
    207429