Title :
Three-dimensional mapping of single-event effects using two photon absorption
Author :
McMorrow, Dale ; Lotshaw, William T. ; Melinger, Joseph S. ; Buchner, Stephen ; Boulghassoul, Younes ; Massengill, Lloyd W. ; Pease, Ronald L.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Carrier generation based on subbandgap two-photon absorption is used to perform three-dimensional mapping of the single-event transient response of the LM124 operational amplifier. Three classes of single-event-induced transients are observed for the input transistor Q20. A combination of experiment and transistor level modeling is used to assign the different classes of measured transients to charge collection across specific junctions. The large-amplitude, positive-going transients cannot be assigned to a single junction, and are identified with a collector-substrate photocurrent.
Keywords :
gamma-ray effects; integrated circuit testing; operational amplifiers; radiation hardening (electronics); two-photon processes; LM124 operational amplifier; charge collection; collector-substrate photocurrent; input transistor Q20; large-amplitude positive-going transients; measured transients; single-event effects; three-dimensional mapping; two photon absorption; Absorption; Circuits; Nonlinear optics; Operational amplifiers; Optical amplifiers; Optical pulse generation; Pulse amplifiers; Semiconductor lasers; Semiconductor materials; Ultrafast optics;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.820742
