• DocumentCode
    879995
  • Title

    Simulation of ultra-small GaAs MESFET´s using quantum moment equations. II. Velocity overshoot

  • Author

    Zhou, Jing-Rong ; Ferry, David K.

  • Author_Institution
    Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
  • Volume
    39
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    1793
  • Lastpage
    1796
  • Abstract
    For Pt.I see ibid., vol.39, p.473-8 (March 1992). The physical physical effects inherent in the operation of ultra-small devices are based on the fact that the critical length (e.g. the gate length or the depletion length) becomes so small that it approaches the coherence length of the electrons that provide the operation which suggests that such small devices must be treated as quantum-mechanical objects. In a previous paper, the authors described the accurate simulation of ultra-small devices, which requires quantum effects such as tunneling and quantum repulsion (complementary to barrier penetration) to be included. This numerical model is based upon a full quantum description based upon moments of the Wigner distribution function. Numerical simulation of ultrasmall MESFETs has been carried out using this model. Here, the authors emphasize the velocity overshoot and other hot-carrier effects and the change of these due to the quantum effects
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; hot carriers; numerical methods; semiconductor device models; GaAs; Wigner distribution function moment; coherence length; critical length; depletion length; gate length; hot-carrier effects; numerical model; numerical simulation; quantum effects; quantum moment equations; quantum repulsion; semiconductor; tunneling; ultra-small devices; ultrasmall MESFET´s; velocity overshoot; Electrons; Equations; Gallium arsenide; Hot carrier effects; Integrated circuit technology; MESFETs; Numerical models; Numerical simulation; Temperature; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.144666
  • Filename
    144666