Title :
A novel concurrent error detection scheme for FFT networks
Author :
Tao, D.L. ; Hartmann, C.R.P.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
The algorithm-based fault tolerance techniques have been proposed to obtain reliable results at very low hardware overhead. Even though 100% fault coverage can be theoretically obtained by using these techniques, the system performance, i.e., fault coverage and throughput, can be drastically reduced due to many practical problems, e.g., round-off errors. A novel algorithm-based fault tolerance scheme is proposed for fast Fourier transform (FFT) networks. It is shown that the proposed scheme achieves 100% fault coverage theoretically. An accurate measure of the fault coverage for FFT networks is provided by taking the round-off error into account. The proposed scheme is shown to provide concurrent error detection capability to FFT networks with low hardware overhead, high throughput, and high fault coverage
Keywords :
digital signal processing chips; error detection; fast Fourier transforms; fault tolerant computing; roundoff errors; FFT networks; algorithm-based fault tolerance techniques; concurrent error detection scheme; fault coverage; round-off errors; system performance; Discrete Fourier transforms; Fast Fourier transforms; Fault detection; Fault tolerance; Hardware; Matrix decomposition; Roundoff errors; Signal processing algorithms; Throughput; Very large scale integration;
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on