Abstract :
Emitter coupled logic circuits transient noise behavior is examined. The mechanisms and causes of feedthrough are analyzed using, first, approximate expressions and, second, an accurate model. The experimental observations of feedthrough give ample evidence of good agreement between the theoretical and computational results. An accurate appraisal of the causes of feedthrough, such as C/SUB b//SUB e/, C/SUB b//SUB c/, c/SUB i//SUB d/, C/SUB i//SUB t/, C/SUB p/, and C/SUB c//SUB u//SUB s/ determine the main factors that offer scope for improvement.
Keywords :
Bipolar transistors; Current-mode logic; Digital integrated circuits; Monolithic integrated circuits; bipolar transistors; current-mode logic; digital integrated circuits; monolithic integrated circuits; Appraisal; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Equivalent circuits; Logic circuits; Noise reduction; Nuclear magnetic resonance; Power system transients;
