DocumentCode :
880110
Title :
LET dependence of the charge collection efficiency of silicon microdosimeters
Author :
Cornelius, Iwan M. ; Rosenfeld, Anatoly B. ; Siegele, Rainer ; Cohen, David D.
Author_Institution :
Centre for Med. Radiat. Phys., Univ. of Wollongong, NSW, Australia
Volume :
50
Issue :
6
fYear :
2003
Firstpage :
2373
Lastpage :
2379
Abstract :
A heavy ion microprobe was used to conduct ion beam induced charge (IBIC) collection imaging of silicon microdosimeters. The GEANT4 Monte Carlo toolkit was used to simulate these measurements to calculate ion energy loss in the device overlayer and energy deposition in the device sensitive volume. A comparison between experimental and theoretical results facilitated the calculation of charge collection efficiency profiles for several ions.
Keywords :
Monte Carlo methods; dosimetry; ion beam effects; silicon radiation detectors; GEANT4 Monte Carlo toolkit; LET dependence; Si; Si microdosimeters; charge collection efficiency; device overlayer; device sensitive volume; energy deposition; heavy ion microprobe; ion beam induced charge collection imaging; Australia; Diodes; Energy loss; Energy measurement; Ion beams; Loss measurement; Monte Carlo methods; Radiative recombination; Silicon on insulator technology; Volume measurement;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2003.820740
Filename :
1263888
Link To Document :
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