DocumentCode
880159
Title
Neutron contribution to CaF2:Mn thermoluminescent dosimeter response in mixed (n/γ) field environments
Author
DePriest, K. Russell ; Griffin, Patrick J.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
50
Issue
6
fYear
2003
Firstpage
2393
Lastpage
2398
Abstract
Thermoluminescent dosimeters (TLDs), particularly CaF2:Mn, are often used as photon dosimeters in mixed (n/γ) field environments. In these mixed field environments, it is desirable to separate the photon response of a dosimeter from the neutron response. For passive dosimeters that measure an integral response, such as TLDs, the separation of the two components must be performed by postexperiment analysis because the TLD reading system cannot distinguish between photon- and neutron-produced response. Using a model of an aluminum-equilibrated TLD-400 (CaF2:Mn) chip, a systematic effort has been made to analytically determine the various components that contribute to the neutron response of a TLD reading. The calculations were performed for five measured reactor neutron spectra and one theoretical thermal neutron spectrum. The five measured reactor spectra all have experimental values for aluminum-equilibrated TLD-400 chips. Calculations were used to determine the percentage of the total TLD response produced by neutron interactions in the TLD and aluminum equilibrator. These calculations will aid the Sandia National Laboratories-Radiation Metrology Laboratory (SNL-RML) in the interpretation of the uncertainty for TLD dosimetry measurements in the mixed field environments produced by SNL reactor facilities.
Keywords
calcium compounds; gamma-ray detection; gamma-ray effects; manganese; neutron detection; neutron effects; thermoluminescent dosimeters; CaF2:Mn; CaF2:Mn thermoluminescent dosimeter response; mixed (n/γ) field environments; neutron contribution; neutron response; passive dosimeters; photon dosimeters; photon response; Aluminum; Dosimetry; Fission reactors; Inductors; Metrology; Neutrons; Particle beams; Performance analysis; Performance evaluation; Semiconductor device measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2003.821608
Filename
1263891
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