Title :
Distortion and noise-induced DC offset in operational amplifiers
Author :
Duffy, William T. ; McCormick, J. Byron ; Hamilton, Douglas J. ; Kerwin, William J.
fDate :
6/1/1975 12:00:00 AM
Abstract :
Experimental measurements on many different commercial operational amplifiers indicate that a sizable d.c. offset voltage occurs which is a function of input signal amplitude and frequency. This offset is shown to be the result of nonlinear distortion in the input stage. A simple nonlinear model is used to analyze the effect, and calculated and experimental results are in good agreement.
Keywords :
Electric distortion; Noise; Operational amplifiers; electric distortion; noise; operational amplifiers; Electron devices; Frequency; MOS devices; MOSFETs; Noise level; Nonlinear distortion; Operational amplifiers; Semiconductor device noise; Semiconductor devices; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1975.1050581
