An improved sine-wave fitting procedure for characterizing data acquisition channels

Author

Pintelon, Rik ; Schoukens, Johan

Author_Institution

Dept. ELEC, Vrije Univ., Brussels, Belgium

Volume

45

Issue

2

fYear

1996

fDate

4/1/1996 12:00:00 AM

Firstpage

588

Lastpage

593

Abstract

This paper presents a new sine-wave fitting procedure for characterizing data acquisition channels and analog-to-digital converters. It overcomes most of the problems encountered with the classical three- or four-parameter sine-wave fitting procedure described in IEEE Standard 1057. The stochastic properties of the new procedure are thoroughly analyzed. Its performance is illustrated by simulations and measurements with a high-frequency sampling scope

Keywords

curve fitting; data acquisition; digital simulation; least squares approximations; nonlinear systems; signal processing; simulation; stochastic processes; aliasing effect; analog-to-digital converters; data acquisition channels; four-parameter sine-wave fitting; multiharmonic sine estimation; noise variance; nonlinear distortions; nonlinear least square algorithm; sine-wave fitting; three-parameter fitting; Analog-digital conversion; Data acquisition; Fitting; Frequency estimation; Helium; Nonlinear distortion; Sampling methods; Signal processing; Stochastic processes; Testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.492793

Filename

492793