• DocumentCode
    88044
  • Title

    An Investigation on the Optimization and Scaling of Complementary SiGe HBTs

  • Author

    Chakraborty, Partha Sarathi ; Moen, Kurt A. ; Cressler, John D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    34
  • Lastpage
    41
  • Abstract
    We use predictive technology computer-aided design to investigate the device design challenges and optimization issues that will be necessarily encountered in scaling of complementary silicon-germanium (C-SiGe) heterojunction bipolar transistors (HBTs). A fully integrated simulation framework was developed to design and optimize device doping and Ge profiles for any given target performance, using important circuit-relevant figures-of-merit. This methodology was successfully utilized to realize device profiles for multiple C-SiGe technology nodes within the context of a C-SiGe scaling roadmap. A method for optimizing the ac performance of SiGe HBTs geared for both high-performance and low-power applications is also presented. The performance metrics of the optimized profiles presented here are then compared with those of existing fabricated devices reported in the literature.
  • Keywords
    Ge-Si alloys; electronic design automation; heterojunction bipolar transistors; semiconductor doping; complementary SiGe HBT; computer-aided design; device doping; heterojunction bipolar transistors; predictive technology; scaling roadmap; Doping; Heterojunction bipolar transistors; Junctions; Optimization; Performance evaluation; Semiconductor process modeling; Silicon germanium; Bipolar junction transistor (BJT); complementary bipolar; complementary silicon–germanium (C-SiGe); heterojunction bipolar transistor (HBT); scaling roadmap; silicon–germanium (SiGe); technology computer-aided design (TCAD);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2225838
  • Filename
    6376151