Title :
Testing and optimizing ADC performance: a probabilistic approach
Author :
Giaquinto, Nicola ; Savino, Mario ; Trotta, Amerigo
Author_Institution :
Dept. of Electr. & Electron., Bari Polytech., Italy
fDate :
4/1/1996 12:00:00 AM
Abstract :
A novel approach to the topic of analog-to-digital converter (ADC) characterization is proposed. The key idea is to describe the behaviour of the device via a suitable conditional probability function, estimated through a modified version of the popular histogram test. Any traditional figure of merit for ADC´s can be accurately evaluated from the proposed probabilistic characterization. Besides, this allows one to optimize the ADC overall performance, determining the best allocation of the output reconstruction levels. The parameters of the modified histogram test are determined as a function of the desired accuracy. Finally, computer simulations illustrate the performance of the method
Keywords :
analogue-digital conversion; automatic testing; computerised instrumentation; digital simulation; electronic equipment testing; optimisation; performance evaluation; probability; simulation; ADC performance; analog-to-digital converter; behaviour; computer simulation; conditional probability function; histogram test; modified histogram test; nonlinearities; output reconstruction; probabilistic characterization; Analog-digital conversion; Computer errors; Computer simulation; Employment; Error correction; Helium; Histograms; Legged locomotion; Software measurement; System testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
