Testing and optimizing ADC performance: a probabilistic approach

Author

Giaquinto, Nicola ; Savino, Mario ; Trotta, Amerigo

Author_Institution

Dept. of Electr. & Electron., Bari Polytech., Italy

Volume

45

Issue

2

fYear

1996

fDate

4/1/1996 12:00:00 AM

Firstpage

621

Lastpage

626

Abstract

A novel approach to the topic of analog-to-digital converter (ADC) characterization is proposed. The key idea is to describe the behaviour of the device via a suitable conditional probability function, estimated through a modified version of the popular histogram test. Any traditional figure of merit for ADC´s can be accurately evaluated from the proposed probabilistic characterization. Besides, this allows one to optimize the ADC overall performance, determining the best allocation of the output reconstruction levels. The parameters of the modified histogram test are determined as a function of the desired accuracy. Finally, computer simulations illustrate the performance of the method

Keywords

analogue-digital conversion; automatic testing; computerised instrumentation; digital simulation; electronic equipment testing; optimisation; performance evaluation; probability; simulation; ADC performance; analog-to-digital converter; behaviour; computer simulation; conditional probability function; histogram test; modified histogram test; nonlinearities; output reconstruction; probabilistic characterization; Analog-digital conversion; Computer errors; Computer simulation; Employment; Error correction; Helium; Histograms; Legged locomotion; Software measurement; System testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.492799

Filename

492799