• DocumentCode
    880519
  • Title

    Foreword - Special issue on semiconductor memory and logic

  • Volume
    10
  • Issue
    5
  • fYear
    1975
  • Firstpage
    254
  • Lastpage
    254
  • Keywords
    Circuit testing; Integrated circuit technology; Josephson junctions; Large scale integration; Logic circuits; Logic testing; Programmable logic arrays; Random access memory; Semiconductor memory; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1975.1050607
  • Filename
    1050607
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=880519