DocumentCode
880566
Title
A CCD line addressable random-access memory (LARAM)
Author
Gunsagar, Kamal C. ; Guidry, Mark R. ; Amelio, Gilbert F.
Volume
10
Issue
5
fYear
1975
Firstpage
268
Lastpage
272
Abstract
A novel approach to charge-coupled device (CCD) memory organization has been conceived and implemented in a 16 384-bit memory chip. It utilizes an isoplanar n-channel silicon gate MOS process in conjunction with self-aligned implanted barrier, buried channel CCD technology. The chip is organized in four parallel, identical sections of 32 independent lines with each line 128 bits long. The four sections are controlled in parallel. Any of the 32 lines (the same line in each of the four sections) can be randomly accessed; hence the name, line addressable random-access memory (LARAM). Each line can be brought to a halt at any of its 128 possible positions. Design features and test results of the memory are described.
Keywords
Charge-coupled devices; Digital integrated circuits; Large scale integration; Monolithic integrated circuits; Random-access storage; Semiconductor storage systems; charge-coupled devices; digital integrated circuits; large scale integration; monolithic integrated circuits; random-access storage; semiconductor storage systems; Aerospace electronics; Charge coupled devices; Circuit synthesis; Clocks; Filling; Frequency; Random access memory; Read-write memory; Silicon; Testing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1975.1050610
Filename
1050610
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