Current hogging injection logic-a new logic with high functional density

A new design concept for bipolar integrated circuits with high functional density will be presented. The basic current hogging injection logic (CHIL) gate consists of a lateral intermediate collector structure, where the last collector simultaneously forms the base region of an inversely operated vertical output transistor. Thus a CHIL gate can be looked at as a CHL gate with a functionally integrated output transistor, or as an integrated injection logic (I/SUP 2/L) inverter with controlled injection. Dc and pulse measurements are discussed and calculated results with a simple model suitable for computer-aided design (CAD) are presented. The static noise immunity of CHIL circuits is compared to CHL and I/SUP 2/L. CHIL circuits are well suitable for large-scale integration (LSI) and are technologically compatible to all circuits fabricated in a standard buried collector (SBC) process.