• DocumentCode
    880742
  • Title

    Determining the test voltage factor function for the evaluation of lightning impulses with oscillations and/or an overshoot

  • Author

    Simón, P. ; Garnacho, F. ; Berlijn, S.M. ; Gockenbach, E.

  • Author_Institution
    LCOE-FFII Lab. of the Polytech. Univ., Madrid, Spain
  • Volume
    21
  • Issue
    2
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    560
  • Lastpage
    566
  • Abstract
    In order to remove the present IEC 60060-1 and IEEE Standard 4 ambiguities in the evaluation of the test voltage when oscillations and/or an overshoot appear superimposed in a lightning impulse, at the end of the 1990s, a European Project within the Standard, Measurement and Testing (SMT) program was developed by KEMA (Netherlands), Schering Institute (Germany), LCOE (Spain), and NGC (United Kingdom) in coordination with the CIGRE Working Group 33.03. The conclusion of this European Project is a new evaluation method called test voltage function K(f) derived on the breakdown behavior of different dielectric media, that removes the standard ambiguity to determine the test voltage of an impulse with oscillations and/or an overshoot. This paper presents the experimental results of the project and deals in depth with the definition of K(f).
  • Keywords
    IEC standards; IEEE standards; dielectric materials; electric breakdown; impulse testing; oscillations; CIGRE working group; European project; IEC 60060-1 standard; IEEE standard; KEMA; LCOE; NGC; Schering Institute; breakdown behavior; dielectric media; lightning impulses; oscillations; overshoot; standard ambiguity; standard measurement and testing program; test voltage factor function; Breakdown voltage; Dielectric breakdown; Frequency; IEC standards; Impulse testing; Lightning; Measurement standards; Standards development; Uncertainty; Voltage control; k-factor; lightning impulses; oscillations; peak value; test voltage; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2005.858807
  • Filename
    1610663