• DocumentCode
    880849
  • Title

    Very low threshold current density of 1.3-μm-range GaInNAsSb-GaNAs3 and 5 QWs lasers

  • Author

    Setiagung, Casimirus ; Shimizu, Hitoshi ; Ikenaga, Yoshihiko ; Kumada, Kouji ; Kasukawa, Akihiko

  • Author_Institution
    Yokohama R&D Labs., Furukawa Electr. Co. Ltd., Yokohama, Japan
  • Volume
    9
  • Issue
    5
  • fYear
    2003
  • Firstpage
    1209
  • Lastpage
    1213
  • Abstract
    The dependence of the threshold current density on the number of wells for 1.3-μm-range edge emitting lasers using GaInNAsSb novel material, at which the incorporation of the small amount of Sb make the two-dimensional growth condition wide, is studied. The lowest record ever reported for the threshold current density per well (Jth A/cm2/well@L=900 μm) for 3 QWs lasers was achieved. GaInNAs-based 5 QWs lasers with the very low threshold current density per well of 160 A/cm2 were successfully grown for the first time. Therefore, no significant deterioration of Jth is observed even though the number of wells increased up to 5. Since Jth of 5 QWs doesn´t increased rapidly compared to SQW and 3 QWs as decreasing the cavity length, it is considered that lower Jth can be obtained by utilizing 5 QWs in devices such VCSELs which use short cavity length.
  • Keywords
    III-V semiconductors; MOCVD; current density; gallium compounds; indium compounds; laser cavity resonators; quantum well lasers; semiconductor growth; 1.3 mum; 1.3-μm-range GaInNAsSb-GaNAs lasers; 3 QWs lasers; 5 QWs lasers; GaInNAs-based 5 QWs lasers; GaInNAsSb novel material; GaInNAsSb-GaNAs; MOCVD; cavity length; edge emitting lasers; two-dimensional growth condition; very low threshold current density; Crystalline materials; Electron emission; Gas lasers; MOCVD; Optical materials; Plasma temperature; Quantum well lasers; Thermal conductivity; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2003.819499
  • Filename
    1263953