DocumentCode
881216
Title
Monolithic integration of InGaAsP/InP lasers and heterostructure bipolar transistors by selective area epitaxy
Author
An, Xiang ; Temkin, H. ; Feygenson, A. ; Hamm, R.A. ; Cotta, M.A. ; Logan, R.A. ; Coblentz, D. ; Yadvish, R.D.
Author_Institution
Colorado State Univ., Ft. Collins, CO, USA
Volume
29
Issue
8
fYear
1993
fDate
4/15/1993 12:00:00 AM
Firstpage
645
Lastpage
646
Abstract
The authors describe the use of selective area epitaxy to prepare monolithically integrated lasers and heterostructure bipolar transistors based on InGaAsP/InP. Selective growth offers a versatile method of lateral integration of structurally dissimilar devices with the different device structures grown side by side in different growth cycles. Individual devices can be optimised separately without any performance compromise. Bipolar transistors grown on the semi-insulating current blocking layers of the buried heterostructure lasers show high gain, high breakdown voltage and excellent high current stability. Laser threshold is reached at a base current as low as 160 mu A and the light output is linear with current to 10 mW.
Keywords
III-V semiconductors; bipolar integrated circuits; chemical beam epitaxial growth; driver circuits; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; integrated optoelectronics; semiconductor growth; semiconductor lasers; 160 muA; 5 to 7 GHz; InGaAsP-InP; MOMBE growth; base current; buried heterostructure lasers; heterostructure bipolar transistors; high breakdown voltage; high current stability; high gain; laser drivers; laser threshold; lateral integration; light output; monolithic integration; selective area epitaxy; semi-insulating current blocking layers;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930432
Filename
209924
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