DocumentCode :
881271
Title :
Waveguide Perturbation Techniques in Microwave Semiconductor Diagnostics
Author :
Champlin, K.S. ; Armstrong, D.B.
Volume :
11
Issue :
1
fYear :
1963
fDate :
1/1/1963 12:00:00 AM
Firstpage :
73
Lastpage :
77
Abstract :
Scattering processes in semiconductors are often studied by observing scattering averages with measurements of various dc transport phenomena. With microwaves, the observation frequency can be of the order of the scattering frequency so that the corresponding microwave transport property may be complex. Thus, in studying detailed scattering mechanisms, a microwave transport experiment contains potentially more information than the analogous dc experiment. This paper discusses perturbation techniques which are useful in determining the microwave conductivity and low-field Hall effect of a bulk semiconductor contained in a waveguide from measurement of the properties of the transmitted wave.
Keywords :
Acoustic scattering; Conductivity; Frequency; Hall effect; Magnetic field measurement; Microwave measurements; Microwave theory and techniques; Particle scattering; Perturbation methods; Semiconductor waveguides;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1963.1125593
Filename :
1125593
Link To Document :
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