Title :
Correlated Proton and Heavy Ion Upset Measurements on IDT Static RAMs
Author :
Campbell, A.B. ; Stapor, W.J. ; Koga, R. ; Kolasinski, W.A.
Author_Institution :
Naval Research Laboratory Washington, D.C. 20375
Abstract :
Upset measurements on four types of CMOS/NMOS RAMs by IDT have been performed using both protons and heavy ions.
Keywords :
CMOS process; Cyclotrons; Energy measurement; Laboratories; MOS devices; Molecular beam epitaxial growth; Particle beams; Performance evaluation; Protons; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334084
