DocumentCode
881433
Title
Trends in Parts Susceptibility to Single Event Upset from Heavy Ions
Author
Nichols, Donald K. ; Price, William E. ; Kolasinski, W.A. ; Koga, R. ; Pickel, James C. ; Blandford, James T., Jr. ; Waskiewicz, A.E.
Author_Institution
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA
Volume
32
Issue
6
fYear
1985
Firstpage
4189
Lastpage
4194
Abstract
New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (Anaheim) and IRT have been combined with published data of JPL [1,2] and Aerospace [3] to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.
Keywords
Aerospace testing; CMOS technology; Circuit simulation; Computational modeling; Computer simulation; Manufacturing; Propulsion; Semiconductor device modeling; Single event upset; System testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1985.4334092
Filename
4334092
Link To Document