Title :
Single Event Upset in Combinatorial and Sequential Current Mode Logic
Author :
Friedman, Arthur L. ; Lawton, Bruce ; Hotelling, Kenneth R. ; Pickel, James C. ; Strahan, Virgil H. ; Loree, Keith
Author_Institution :
Questron Corporation, Los Angeles, CA
Abstract :
SEU testing of both combinatorial and sequential CML of identical technologies with Cf252 and Am241 heavy ion sources revealed agreement in the numbers of device disturbances in both categories of logic. The data confirms that terminal latch upset is primarily due to flip-flop toggling rather than by data path combinatorial logic disturbances.
Keywords :
Circuit testing; Counting circuits; Flip-flops; Ion sources; Latches; Logic devices; Logic testing; Sequential analysis; Single event upset; Strips;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334097
