• DocumentCode
    8815
  • Title

    Wavelet-Based Trace Alignment Algorithms for Heterogeneous Architectures

  • Author

    Ozdal, Muhammet Mustafa ; Jaleel, Aamer ; Narvaez, Paolo ; Burns, Steven ; Srinivasa, Ganapati

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    34
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    381
  • Lastpage
    394
  • Abstract
    Heterogeneous architectures with single-instruction set architecture (ISA) asymmetric cores can improve both the performance and energy efficiency of software execution by dynamically selecting the most appropriate core type to run each execution thread. In this paper, we propose a trace-based methodology to explore power and performance benefits of single-ISA heterogeneous core architectures. The basic idea is to collect multiple traces by running a workload on different homogeneous platforms, and to align these traces for offline analysis. For this, we propose a wavelet-based similarity metric, which captures both fine-grain and coarse-grain software phases across different traces. Then, we propose a scalable dynamic programming algorithm to optimize this metric to align the traces. Our experiments show that the runtime and energy values predicted by our offline methodology have good accuracy with respect to the real measurements from a prototype heterogeneous system.
  • Keywords
    dynamic programming; instruction sets; multiprocessing systems; wavelet transforms; ISA asymmetric cores; coarse-grain software phase; energy value; fine-grain software phase; heterogeneous architecture; runtime value; scalable dynamic programming algorithm; single-instruction set architecture; software execution; trace-based methodology; wavelet-based similarity metric; wavelet-based trace alignment algorithms; Continuous wavelet transforms; Hardware; Heuristic algorithms; Measurement; Radiation detectors; Runtime; Software; Heterogeneous architectures; heterogeneous architectures; system level CAD; system-level CAD; trace alignment; trace analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2387856
  • Filename
    7004789