Title :
Software Techniques for Detecting Single-Event Upsets in Satellite Computers
Author :
Tront, Joseph G. ; Armstrong, James R. ; Oak, Jayawant V.
Author_Institution :
Department of Electrical Engineering Virginia Polytechnic Institute and State University Blacksburg, Virginia 24061
Abstract :
This paper describes a technique for incorporating a self-testing capability into the software of a microprocessor-based control system. The technique is aimed towards power limited as well as size and weight constrained systems such as those found in satellites. The single-event upsets injected into the simulated system are modeled after those which would be produced by a cosmic ray intrusion. Although the implementation primarily uses a software system modification to attain self-testing, the technique also requires an additional hardware watchdog timer to ensure reliable functioning of the control system. The modifications do not incur extensive time or memory overheads. The technique has been verified, for two microprocessors with diverse architectures, using computer simulations.
Keywords :
Built-in self-test; Computational modeling; Computer architecture; Computer simulation; Control systems; Hardware; Microprocessors; Power system modeling; Satellites; Software systems;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334099