Transients in Markov Chains

Author

Sklansky, J. ; Kaplan, K. R.

Author_Institution

RCA Labs., Princeton, N. J.

Issue

fYear

1963

Firstpage

921

Lastpage

922

Keywords

Automata; Automatic testing; Computational modeling; Performance evaluation; Stochastic processes; TV;

fLanguage

English

Journal_Title

Electronic Computers, IEEE Transactions on

Publisher

ieee

ISSN

0367-7508

Type

DOI

10.1109/PGEC.1963.263601

Filename

4038045

Link To Document