DocumentCode
881631
Title
Use of CF-252 to Determine Parameters for SEU Rate Calculation
Author
Blandford, J.T., Jr. ; Pickel, J.C.
Author_Institution
IRT Corporation 101 S. Kraemer, Suite 132 Placentia, CA 92670
Volume
32
Issue
6
fYear
1985
Firstpage
4282
Lastpage
4286
Abstract
A Cf-252 irradiation facility for single event testing of microcircuits has been developed. Testing techniques have been refined to include the capability of determining LET thresholds as well as event cross-sections. The capabilities and limitations of Cf-252 in testing to provide parameters for calculation of SEU rate in the heavy ion environment of space are discussed.
Keywords
Costs; Degradation; Discrete event simulation; Electronic equipment testing; Fixtures; Ion sources; Neutrons; Resistors; Single event upset; Test facilities;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1985.4334109
Filename
4334109
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