DocumentCode
881787
Title
Error minimisation in the measurement of bipolar collector and emitter resistances
Author
Choma, John, Jr.
Volume
11
Issue
2
fYear
1976
fDate
4/1/1976 12:00:00 AM
Firstpage
318
Lastpage
322
Abstract
An analysis of open-circuited collector and forced beta methods for emitter and collector resistance determination is presented. The analysis particularly focuses attention on high-injection effects and the influences of recombination within, and at the surface of, junction depletion layers. Semiquantitative criteria for minimisation of measurement error evolve and additionally, methods for extraction of certain inverse and nonideal diode parameters are suggested.
Keywords
Bipolar transistors; Measurement errors; Resistance measurement; bipolar transistors; measurement errors; resistance measurement; Bipolar transistors; Diodes; Electrical resistance measurement; Forward contracts; Helium; Measurement errors; Minimization methods; Semiconductor process modeling; Surface resistance; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1976.1050721
Filename
1050721
Link To Document