DocumentCode :
882005
Title :
Single-chip multiple-frequency VHF low-impedance micro piezoelectric resonators
Author :
Yan, Lijun ; Wei Pang ; Eun Sok Kim ; Tang, W.C.
Author_Institution :
Dept. of Mech. & Aerosp. Eng., Univ. of California, Irvine, CA, USA
Volume :
27
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
246
Lastpage :
248
Abstract :
This letter reports on the design, fabrication, and testing a new class of low-impedance multiple-frequency micromechanical resonator using piezoelectric transduction mechanism. The resonator is fabricated out of a 3-μm-thick silicon layer on a silicon-on-insulator wafer with a low-temperature post-CMOS compatible process. Two types of low-impedance resonators using the same design principle are presented here. The center frequency of the novel resonator is set by the lithographically defined in-plane dimension of the device (width of bar or radius of disk). The 200-μm-diameter disk-shaped resonator is measured to have an impedance of 1.6 k/spl Omega/ at the resonant frequency of 45.4 MHz, with a quality factor of 1100. The bar-type resonator is measured to have an impedance of 920 /spl Omega/ at 60 MHz, exhibiting a Q factor of 1400.
Keywords :
Q-factor; VHF devices; crystal resonators; lithography; micromechanical resonators; silicon; silicon-on-insulator; 1.6 kohm; 200 micron; 3 micron; 45.4 MHz; 60 MHz; 920 ohm; CMOS process; Si; VHF resonators; bar-type resonator; disk-shaped resonator; in-plane dimension; low-impedance resonators; microelectromechanical system; micromechanical resonator; piezoelectric resonators; piezoelectric transduction mechanism; quality factor; resonant frequency; silicon-on-insulator wafer; Fabrication; Film bulk acoustic resonators; Frequency measurement; Impedance measurement; Micromechanical devices; Piezoelectric films; Q factor; Q measurement; Resonant frequency; Silicon; Impedance; microelectromechanical system (MEMS); piezoelectric; resonator; wireless communication;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2006.871881
Filename :
1610775
Link To Document :
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