DocumentCode

882050

Title

A model for radiation damage in metal-oxide-semiconductor structures

Author

Grove, A.S. ; Snow, E.H.

Volume

54

Issue

6

fYear

1966

fDate

6/1/1966 12:00:00 AM

Firstpage

894

Lastpage

895

Keywords

Anodes; Capacitance measurement; Charge carrier processes; Electron traps; Ionizing radiation; MOS capacitors; Silicon compounds; Snow; Tungsten; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1966.4910

Filename

1446840