Title :
A high power MOSFET with a vertical drain electrode and a meshed gate structure
Author :
Yoshida, Isao ; Kubo, Masaharu ; Ochi, Shikayuki
Abstract :
A MOSFET with a maximum power of 200 W in a 5/spl times/5 mm/SUP 2/ chip which exhibits 20-A current, 3000-millimho transconductance and 100-V breakdown voltage has been developed. The features of the device structure are a vertical drain electrode which makes it possible to use most of the surface area for the source electrode, and a meshed gate structure which realizes an increase in the channel width per unit area. The p-channel device with an offset gate structure was fabricated from an n on p/SUP +/ epitaxial wafer by using polysilicon gate and ion implantation processes. The device can be operated stably at ambient temperatures up to 180/spl deg/C. While the bipolar transistor is a suitable power device in the low voltage region, the MOSFET looks more promising in the high voltage region than the V-FET and the bipolar transistor.
Keywords :
Field effect transistors; Power transistors; Semiconductor device manufacture; field effect transistors; power transistors; semiconductor device manufacture; Application specific integrated circuits; Bipolar transistors; Electric breakdown; Electrodes; Ion implantation; Low voltage; MOSFET circuits; Power MOSFET; Surface resistance; Temperature;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1976.1050761