• DocumentCode
    882247
  • Title

    A high power MOSFET with a vertical drain electrode and a meshed gate structure

  • Author

    Yoshida, Isao ; Kubo, Masaharu ; Ochi, Shikayuki

  • Volume
    11
  • Issue
    4
  • fYear
    1976
  • Firstpage
    472
  • Lastpage
    477
  • Abstract
    A MOSFET with a maximum power of 200 W in a 5/spl times/5 mm/SUP 2/ chip which exhibits 20-A current, 3000-millimho transconductance and 100-V breakdown voltage has been developed. The features of the device structure are a vertical drain electrode which makes it possible to use most of the surface area for the source electrode, and a meshed gate structure which realizes an increase in the channel width per unit area. The p-channel device with an offset gate structure was fabricated from an n on p/SUP +/ epitaxial wafer by using polysilicon gate and ion implantation processes. The device can be operated stably at ambient temperatures up to 180/spl deg/C. While the bipolar transistor is a suitable power device in the low voltage region, the MOSFET looks more promising in the high voltage region than the V-FET and the bipolar transistor.
  • Keywords
    Field effect transistors; Power transistors; Semiconductor device manufacture; field effect transistors; power transistors; semiconductor device manufacture; Application specific integrated circuits; Bipolar transistors; Electric breakdown; Electrodes; Ion implantation; Low voltage; MOSFET circuits; Power MOSFET; Surface resistance; Temperature;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1976.1050761
  • Filename
    1050761