Title :
A two-lump transistor model for computer circuit simulation
Author :
Divekar, D.A. ; Dutton, Robert W.
Abstract :
Base resistance is calculated using DC measurements of base current as a function of base-emitter voltage. It is shown that a two-transistor lumped model gives an excellent fit to the measured data. The physical basis for model partitioning and the extension of the model to AC applications is discussed.
Keywords :
Bipolar transistors; Circuit analysis computing; Semiconductor device models; bipolar transistors; circuit analysis computing; semiconductor device models; Breakdown voltage; Circuit simulation; Electrical resistance measurement; Electron devices; Microcomputers; Microwave devices; Microwave transistors; Real time systems; Solid state circuits; Ultrasonic imaging;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1976.1050804
