Title :
Memory-free low-cost designs of advanced encryption standard using common subexpression elimination for subfunctions in transformations
Author :
Hsiao, Shen-Fu ; Chen, Ming-Chih ; Tu, Chia-Shin
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
fDate :
3/1/2006 12:00:00 AM
Abstract :
In this paper, we propose area-efficient Advanced Encryption Standard (AES) processor designs by applying a new common-subexpression-elimination (CSE) algorithm to the subfunctions that realize the various transformations in AES encryption and decryption. The first category of subfunctions is derived by combining adjacent transformations in each AES round into a new transformation. The other category of subfunctions is from the integrated transformations in the AES encryption and decryption process with shared common operations. Then the proposed bit-level CSE algorithm reduces further the area cost of realizing the subfunctions by extracting the common factors in the bit-level expressions of these subfunctions. The separate area-reduction effects of combinations, integrations, and CSE optimization mentioned above are analyzed in order to examine the efficiency of each technique. Cell-based implementation results show that the proposed AES designs can achieve am area reduction rate of about 20% compared with Synopsys optimization results
Keywords :
cryptography; integrated circuit design; microprocessor chips; AES decryption; AES encryption; AES processor; Synopsys optimization; advanced encryption standard processor; area-reduction effects; bit-level expressions; cell-based implementation; common subexpression elimination; Algorithm design and analysis; Costs; Cryptography; Design optimization; Galois fields; Helium; Integrated circuit synthesis; NIST; Process design; Very large scale integration; Advanced Encryption Standard (AES); Galois fields; cryptography; integrated circuit design; optimization; very large scale integration (VLSI);
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.859052