Title :
CCM-a new low-noise charge carrier multiplier suitable for detection of charge in small pixel CCD image sensors
Author :
Hynecek, Jaroslav
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fDate :
8/1/1992 12:00:00 AM
Abstract :
A new charge detection concept, useful for small pixel CCD image sensors, where the collected signal carriers are first multiplied before charge is converted into an output voltage is described. The carrier multiplication is performed in a low-noise charge carrier multiplier (CCM) which is located in a CCD channel. The multiplication occurs during the charge transfer process and is externally controllable by suitably arranged device lateral fields
Keywords :
CCD image sensors; charge measurement; electric noise measurement; electron device noise; CCD channel; CCM; carrier multiplication; charge detection; charge transfer process; device lateral fields; low-noise charge carrier multiplier; noise measurement; signal carriers; small pixel CCD image sensors; Charge carriers; Charge coupled devices; Charge-coupled image sensors; Dark current; Image converters; Image sensors; Optoelectronic and photonic sensors; Pixel; Signal to noise ratio; Solid state circuits;
Journal_Title :
Electron Devices, IEEE Transactions on
