DocumentCode :
883328
Title :
Some remarks about the use of the charge-neutrality approximation in the simulation of diffusion processes
Author :
Buonomo, Antonio ; Di Bello, Carlo
Author_Institution :
Istituto di Ingegneria Elettronica, Salerno Univ., Italy
Volume :
40
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
885
Lastpage :
889
Abstract :
Doping profiles in bipolar devices are numerically calculated taking into account the actual space charge produced during the diffusion process, which is described by standard models based upon effective diffusivities. The influence of this charge on the diffusion of dopants was examined for arsenic/boron double diffusion in order to evaluate the errors on profiles obtained using the well-known approximation of space-charge neutrality. Numerical results show that this approximation satisfactorily predicts practical doping profiles except for short-time low-temperature diffusion
Keywords :
diffusion in solids; doping profiles; numerical analysis; semiconductor device models; space charge; Si:As,B; bipolar devices; charge-neutrality approximation; diffusion process simulation; doping profiles; effective diffusivities; models; numerical results; polysilicon emitter; space charge; Diffusion processes; Doping profiles; Electric potential; Helium; Impurities; Numerical simulation; Poisson equations; Semiconductor process modeling; Space charge; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.210194
Filename :
210194
Link To Document :
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