• DocumentCode
    883328
  • Title

    Some remarks about the use of the charge-neutrality approximation in the simulation of diffusion processes

  • Author

    Buonomo, Antonio ; Di Bello, Carlo

  • Author_Institution
    Istituto di Ingegneria Elettronica, Salerno Univ., Italy
  • Volume
    40
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    885
  • Lastpage
    889
  • Abstract
    Doping profiles in bipolar devices are numerically calculated taking into account the actual space charge produced during the diffusion process, which is described by standard models based upon effective diffusivities. The influence of this charge on the diffusion of dopants was examined for arsenic/boron double diffusion in order to evaluate the errors on profiles obtained using the well-known approximation of space-charge neutrality. Numerical results show that this approximation satisfactorily predicts practical doping profiles except for short-time low-temperature diffusion
  • Keywords
    diffusion in solids; doping profiles; numerical analysis; semiconductor device models; space charge; Si:As,B; bipolar devices; charge-neutrality approximation; diffusion process simulation; doping profiles; effective diffusivities; models; numerical results; polysilicon emitter; space charge; Diffusion processes; Doping profiles; Electric potential; Helium; Impurities; Numerical simulation; Poisson equations; Semiconductor process modeling; Space charge; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.210194
  • Filename
    210194