Title :
Temperature coefficient of resolution of lateral bipolar magnetotransistors
Author :
Kung, William ; Nathan, Arokia
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fDate :
5/1/1993 12:00:00 AM
Abstract :
The authors present measurement results of the temperature coefficient (TC) of magnetic field resolution Bmin for dual-collector lateral bipolar magnetotransistors (MTs)-over a temperature range 273 K⩽T⩽373 K. For a bandwidth of 500 Hz centered around 750 Hz, the resolution turns out to be 600 nT at room temperature with a TC of +2.3×10-3/K. With the MT operating in medium injection, there is very little dependence of B min on bias conditions. In this regime, the correlation (Γ) between collector noise currents is the highest (near unity), where the forward current gain β of the MT is at its maximum. At higher injection levels, a degradation in Γ is observed, possibly due to emitter crowding effects, behaving in a manner similar to β. The degree of coherence appears to be dependent on frequency; Γ is higher at low frequencies where the base 1/f noise predominates and Γ degrades at higher frequencies when white noise levels from the collector epi region become significant
Keywords :
bipolar transistors; electric sensing devices; magnetic field measurement; random noise; semiconductor device noise; white noise; 273 to 373 K; 500 Hz; base 1/f noise; collector epi region; collector noise currents; degree of coherence; emitter crowding effects; forward current gain; lateral bipolar magnetotransistors; magnetic field sensor; medium injection; temperature coefficient of resolution; white noise levels; Degradation; Frequency; Magnetic devices; Magnetic field measurement; Magnetic fields; Magnetic sensors; Signal to noise ratio; Spatial resolution; Temperature dependence; Temperature distribution;
Journal_Title :
Electron Devices, IEEE Transactions on