• DocumentCode
    883471
  • Title

    I/sup 2/L DC functional requirements

  • Author

    Davies, Roderick D. ; Estreich, Donald B. ; Meindl, James D. ; Dutton, Robert W.

  • Volume
    12
  • Issue
    2
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    208
  • Lastpage
    210
  • Abstract
    Factors controlling the DC operational limits of integrated injection logic (I/SUP 2/L) imposed by the interaction between the inverse n-p-n switching transistors and the lateral p-n-p transistor formed with the injector are discussed. The operational limit is shown to be a function only of structural and doping level parameters. An upper limit on epitaxial resistivity is shown to result.
  • Keywords
    Bipolar integrated circuits; Integrated logic circuits; bipolar integrated circuits; integrated logic circuits; Charge carrier processes; Current measurement; Doping; Geometry; Influenza; Logic devices; Predictive models; Propagation delay; Solid modeling; Testing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1977.1050874
  • Filename
    1050874
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=883471