DocumentCode :
883665
Title :
On the modeling and design of Schottky field-effect transistors
Author :
Vega, Reinaldo A.
Author_Institution :
Microelectron. Eng. Dept., Rochester Inst. of Technol., NY, USA
Volume :
53
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
866
Lastpage :
874
Abstract :
A short-channel threshold-voltage model and an Airy function transfer-matrix tunneling model have been adopted and modified to result in a one-dimensional Schottky field-effect transistor (SFET) model. Model calculations were performed in MATLAB 7, and the results suggest that, for small Schottky barrier (SB) heights, the tunneling current does not play a dominant role in the total ON-state current. Instead, increases in current at the gate biases beyond the source-body flat band voltage (Vsbfb) are due mostly to the increases in thermal current from SB lowering (SBL), not tunneling current modulation. Also, the inclusion of SBL in this model suggests that barrier heights on the order of 0.25 eV can indeed support greater than 1-mA/μm drive current density for both n-channel and p-channel SFETs for 25-nm CMOS.
Keywords :
CMOS integrated circuits; Schottky gate field effect transistors; current density; mathematics computing; 25 nm; Airy function transfer matrix tunneling model; CMOS; MATLAB 7; Schottky field effect transistors; drive current density; short channel threshold voltage model; source-body flat band voltage; Current density; FETs; MATLAB; Mathematical model; Microelectronics; Schottky barriers; Semiconductor device modeling; Silicides; Tunneling; Voltage; Airy function; Schottky barrier (SB); ambipolar; metal source/drain (S/D); nanotechnology; semiconductor device modeling; tunneling model;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.871176
Filename :
1610921
Link To Document :
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