Accurate tape analysis of the attenuator-coated helical slow-wave structure

Author

Duan, Zhaoyun ; Gong, Yubin ; Wang, Wenxiang ; Basu, B.N. ; Wei, Yanyu

Author_Institution

Nat. Key Lab. of High Power Vacuum Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

Volume

53

Issue

4

fYear

2006

fDate

4/1/2006 12:00:00 AM

Firstpage

903

Lastpage

909

Abstract

The tape-helix model is used to analyze the helical slow-wave structure considering the helix turns to be effectively shorted by the resistive attenuator coating on dielectric helix-support rods. An effective surface resistivity is calculated based on the resistive coating on discrete support rods. The results of the analysis are validated against reported experimental results in the special case of no attenuator coating. The attenuation constant and the phase propagation constant as well as the interaction impedance of the structure obtained by the present analysis in the tape model are compared with those obtained by the sheath-helix model reported elsewhere. The dependence of the attenuation constant, the phase propagation constant, and the interaction impedance on the effective surface resistivity is accurately predicted by our tape-helix model.

Keywords

attenuators; electrical resistivity; slow wave structures; accurate tape analysis; discrete support rod; helical slow wave structure; helical slow-wave structure; resistive attenuator coating; surface resistivity; tape helix model; Attenuation; Attenuators; Coatings; Conductivity; Dielectrics; Laboratories; Propagation constant; Surface fitting; Surface impedance; Vacuum technology; Attenuator coating; helix traveling-wave tube (TWT); slow-wave structure (SWS); tape-helix model;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2006.871168

Filename

1610926