Title :
VMOS memory technology
Author :
Rodgers, T.J. ; Hiltpold, W. Randy ; Frederick, Bruce ; Barnes, John J. ; Jenne, Fredrick B. ; Trotter, James D.
fDate :
10/1/1977 12:00:00 AM
Abstract :
VMOS technology is discussed as it applies to semiconductor memory. A 45-ns 1-kbit static RAM with a die size of 81 mil×125 mil and a cell area of 3.0 square mils is presented. The device is fabricated with the original grounded-source version of the VMOS process. Design considerations and electrical data are given for a 30-ns scaled version of the RAM with a 55 mil×80 mil die size and a 1.25-square-mil cell area. Two new VMOS process options are presented. In one option the grounded-source limitation of VMOS is removed by the addition of diffused buried layers. These buried layers can be used as dynamic RAM storage capacitors. Electrical data are presented for a VMOS dynamic RAM cell whose area is 0.36 square mils (6-μm rules). In the third VMOS process option, an extra layer of polysilicon is added to the grounded-source process to fabricate an erasable programmable read only memory (EPROM) cell, also with a 0.36-square-mil area.
Keywords :
Field effect integrated circuits; Integrated memory circuits; Random-access storage; Read-only storage; field effect integrated circuits; integrated memory circuits; random-access storage; read-only storage; Boron; Capacitors; DRAM chips; EPROM; Fabrication; MOSFETs; Random access memory; Read only memory; Read-write memory; Resistors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1977.1050945