DocumentCode
884675
Title
Imaging properties of the Medipix2 system exploiting single and dual energy thresholds
Author
Tlustos, L. ; Ballabriga, R. ; Campbell, M. ; Heijne, E. ; Kincade, K. ; Llopart, X. ; Stejskal, P.
Author_Institution
PH Div., CERN, Geneva
Volume
53
Issue
1
fYear
2006
Firstpage
367
Lastpage
372
Abstract
Low noise, high resolution, and high dose efficiency are the common requirements for most X-ray imaging applications. The dose efficiency is especially important for medical imaging systems. We present the imaging performance of the Medipix2 readout chip bump bonded to a 300 mum thick Si detector as a function of the detection threshold, a free parameter not available in conventional charge integrating imaging systems. Spatial resolution has been measured using the modulation transfer function (MTF) and it varies between 8.2 line-pairs/mm and 11.0 line pairs/mm at an MTF value of 70%. An associated measurement of noise power spectrum (NPS) permits us to derive the detective quantum efficiency (DQE) which can be as a high as 25.5% for a broadband incoming spectrum. The influence of charge diffusion in the sensor together with threshold variation in the readout chip is discussed. Although the Medipix2 system is used in photon counting mode with a single threshold in energy, the system is also capable of counting within a given energy window as narrow as ~1.4 keV. First measurements and images using this feature reveal capabilities that allow identifying fluorescence and other sources of disturbance
Keywords
imaging; noise; nuclear electronics; readout electronics; silicon radiation detectors; transfer functions; 300 mum; Medipix2 readout chip; Si detector; X-ray imaging; charge diffusion; charge integrating imaging systems; detection threshold; detective quantum efficiency; dose efficiency; energy thresholds; fluorescence; imaging properties; medical imaging systems; modulation transfer function; noise power spectrum; photon counting mode; readout chip; spatial resolution; Biomedical imaging; Bonding; Detectors; Energy resolution; High-resolution imaging; Image resolution; Optical imaging; Semiconductor device measurement; Spatial resolution; X-ray imaging; Radiation detectors; X-ray image sensors; X-ray spectroscopy detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2006.869844
Filename
1611005
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