• DocumentCode
    884888
  • Title

    ITC 2006 panels

  • Author

    Stolicny, Carol

  • Author_Institution
    Intel
  • Volume
    24
  • Issue
    1
  • fYear
    2007
  • Firstpage
    94
  • Lastpage
    96
  • Abstract
    The International Test Conference technical program has long included panel sessions that provide an informal, entertaining opportunity for ITC audiences to engage in discussion and debates with industry and research experts on a wide range of subjects. This tradition continued in a new venue in 2006 with an intriguing slate of panel sessions. In this column, the ITC 2006 panel organizers capture the deliberations and results from their respective panels for D&T readers who may not have had the opportunity to attend the conference or perhaps attended different, parallel panel discussions.
  • Keywords
    Bridges; Code standards; Companies; Costs; Delay; Electronic equipment testing; Redundancy; Semiconductor device testing; Standardization; Vehicle safety; ITC; International Test Conference;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2007.20
  • Filename
    4212076