DocumentCode
884888
Title
ITC 2006 panels
Author
Stolicny, Carol
Author_Institution
Intel
Volume
24
Issue
1
fYear
2007
Firstpage
94
Lastpage
96
Abstract
The International Test Conference technical program has long included panel sessions that provide an informal, entertaining opportunity for ITC audiences to engage in discussion and debates with industry and research experts on a wide range of subjects. This tradition continued in a new venue in 2006 with an intriguing slate of panel sessions. In this column, the ITC 2006 panel organizers capture the deliberations and results from their respective panels for D&T readers who may not have had the opportunity to attend the conference or perhaps attended different, parallel panel discussions.
Keywords
Bridges; Code standards; Companies; Costs; Delay; Electronic equipment testing; Redundancy; Semiconductor device testing; Standardization; Vehicle safety; ITC; International Test Conference;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.20
Filename
4212076
Link To Document