Author_Institution :
University of Alabama
Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
IMSTW 07; MSE 07; SWTW 07; TTTC; test technology;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.29
