Title :
A novel multibridge-channel MOSFET (MBCFET): fabrication technologies and characteristics
Author :
Lee, Sung-Young ; Kim, Sung-Min ; Yoon, Eun-Jung ; Oh, Chang-Woo ; Chung, Ilsub ; Park, Donggun ; Kim, Kinam
Author_Institution :
Samsung Electron. Co., Kyungki-Do, South Korea
Abstract :
We have demonstrated a novel three-dimensional multibridge-channel metal-oxide-semiconductor field-effect transistor (MBCFET). This transistor was successfully fabricated using a conventional complementary metal-oxide-semiconductor process. We introduce the fabrication technologies and electrical characteristics of MBCFET in comparison with a conventional planar MOSFET. The MBCFET has more benefits than a conventional MOSFET. It shows 4.6 times larger current drivability than a planar MOSFET. This is due to the vertically stacked multibridge channels. The subthreshold swing of MBCFET is 61 mV/dec, which is almost an ideal value due to the thin body surrounded by gate. Based on a simulation result, we show that the MBCFET will have a large on-off state current ratio at short channel transistors.
Keywords :
CMOS integrated circuits; MOSFET; complementary metal-oxide-semiconductor process; fabrication technologies; multibridge-channel MOSFET; on-off state current ratio; short channel transistors; subthreshold swing; vertically stacked multibridge channels; CMOS process; Double-gate FETs; Epitaxial growth; Epitaxial layers; Fabrication; Leakage current; MOSFET circuits; Silicon germanium; Substrates; Voltage;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2003.820777